This tool is designed for the automated IQE analysis of crystalline silicon solar cells. Some features are:
The solar cells are illuminated with variable light, either homogeneously over an area of 20 x 20 mm, or with a focussed spot of approx. 1 x 3 mm².
Full area EQE & reflectance measurements by moving the 4 cm² illuminated area continuously.
Monochromatic light between 280-1600 nm from monochromator (2 gratings, slit width and order filter changed automatically). Typically used bandwidth is 8 nm FWHM and the wavelength accuracy is 1 nm.
White bias light up to 1.2 suns is restricted to the area of monochromatic illumination.
Bias-ramp for automatic determination of the correct bias light intensity for quasi-absolute EQE measurements in only one wavelength scan. The procedure is also useful to check the linearity of the solar cell.
The reflectance is measured under an 8° tilted beam of 2 x 2 cm² area with a BaSO4-coated integrating sphere.
Batch mode for series of measurements under different conditions.
The solar cells are held on a temperature controlled vacuum chuck (25 °C) which can be moved by a motorized x-y-z stage. The temperature is measured directly at the back of the solar cell.
Transimpedance amplifier (max. 200 mA) holds solar cell at short circuit with remote sense and contact quality check.
Automatic calibration of EQE and reflectance
– increases throughput and reduces the necessary time of operator interaction.
– makes the operation safer against human errors (misalignment, bias light, etc).
– avoids degradation of the reference solar cell by manual handling.
Motorized contact-setting and change-over between EQE and reflectance measurements.
Data analysis by comparison with analytical electrical and optical model.
Duration:
– ca. 1 sec. per wavelength for spot measurement (2 x 2 cm²)
– ca. 9 sec. per wavelength for 12.5 x 12.5 cm² solar cell
– ca. 12 sec. per wavelength for 15.6 x 15.6 cm² solar cell
EQE and reflectance mapping with focussed light spot (QMAP) within 5 min for a 15.6 x 15.6 cm² cell per map and wavelength.